Scan-Chain Intra-Cell Aware Testing
نویسندگان
چکیده
منابع مشابه
Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint
The full-scan design is considered to be the best DfT discipline [1]. It can be automated using commercially available design tools. Over the years, it has gained widespread acceptability in system design environments and is now commonly used to test digital circuitry in integrated circuits or System-on-Chip cores. However, scan-based architectures are expensive in power consumption as each tes...
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Designing a testable circuit is often a two step process. First, the circuit is designed to conform to the functional specifications. Then, the testability aspects are added. By taking the test strategy into account during the synthesis of the circuit, the overhead due to the test features can be reduced. We present a synthesis-for-scan procedure, called beneficial scan, that orders the scan ch...
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We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing the test application time for full scan embedded cores. Test application time reduction is achieved by dividing the scan chain into multiple partitions and shifting in the same vector to each scan chain through a single scan in input. The experimental results for the ISCAS89 circuits showed that PS...
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Boundary-Scan testing is used more and more to overcome many of the testability issues facing today’s higher density designs. In the past, Boundary-Scan has been used successfully with ATE’s and external PC based test systems. Since Boundary-Scan tests are structural in nature, they can be reused with often minor modifications in the embedded arena. Further, these same tests can be used in the ...
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Scan Based Delay Testing is used to perform delay testing in the sequential circuits which have the scan capability. In this paper, basics of delay testing and several techniques to perform delay testing for scan based circuits are discussed. The construction of several scan flip-flops along with their advantages and disadvantages is also presented.
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ژورنال
عنوان ژورنال: IEEE Transactions on Emerging Topics in Computing
سال: 2018
ISSN: 2168-6750
DOI: 10.1109/tetc.2016.2624311